Force Modulation Mode AFM and Ultrasonic Force Microscopy.
نویسندگان
چکیده
منابع مشابه
Frequency and force modulation atomic force microscopy: low-impact tapping-mode imaging without bistability
Since the 1980s, atomic force microscopy (AFM) has rapidly developed into a versatile, high-resolution characterization technique, available in a variety of imaging modes. Within intermittent-contact tapping-mode, imaging bistability and sample mechanical damage continue to be two of the most important challenges faced daily by AFM users. Recently, a new double-control-loop tapping-mode imaging...
متن کاملMultimodal microscopy using 'half and half' contact mode and ultrasonic force microscopy.
Advances in the design and fabrication of multifunctional nanostructured materials require characterization techniques capable of simultaneously mapping multiple material properties with nanoscale resolution. We show that this can be achieved by combining nanomechanical information from ultrasonic force microscopy (UFM) with simultaneously acquired friction force and conductivity measurements f...
متن کاملElastic properties of living fibroblasts as imaged using force modulation mode in atomic force microscopy.
Using the force modulation mode in atomic force microscopy, we measured elastic properties of living mouse fibroblasts (NIH3T3) in a culture medium. The topographic images of the cellular surface and the corresponding elastic images of the cellular surface were able to be captured simultaneously with high spatial resolution. The consecutive images were useful for examining time-dependent change...
متن کاملAtomic Force Microscopy at Ultrasonic Frequencies
Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfaces. A micro-fabricated elastic beam with an integrated sharp sensor tip at its end is scanned over the sample surface. With various dynamic modes, leading to Force Modulation Microscopy [1], Ultrasonic Force Microscopy [2], Atomic Force Acoustic Microscopy (AFAM) [3–5], Microdeformation Microscop...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Hyomen Kagaku
سال: 1996
ISSN: 0388-5321,1881-4743
DOI: 10.1380/jsssj.17.15